污水處理設備 污泥處理設備 水處理過濾器 軟化水設備/除鹽設備 純凈水設備 消毒設備|加藥設備 供水/儲水/集水/排水/輔助 水處理膜 過濾器濾芯 水處理濾料 水處理劑 水處理填料 其它水處理設備
鉑悅儀器（上海）有限公司
鉑悅儀器（上海）有限公司
產品描述：
電學特性
FEOL Electrical Characterization
In IC device manufacturing electrical characteristics of layers and films must be well controlled. Conventional contact test methods on monitor wafers, like the 4-point probe FSM offers, do no longer meet modern requirements. State of the art IC feature extremely thin, often only a few atomic layers of material. FSM's contactless RsL probe for sheet resistance and leakage as well as the non-destructive EOT probe for IC-CV measurements meet the challenge to characterize ultra shallow junctions and thin dielectric materials on production wafers.
FSM offers contact and non-contact electrical characterization metrology used in FEOL device making.
3DIC TSV and BWS TTV硅片表面形貌測量
Film Stress薄膜應力量測儀
FEOL Electrical Characterization 電學特性
Thin wafer metrology 晶圓測量學
Film Adhesion漆膜附著力測試
FSM offers contact and non-contact electrical characterization metrology used in FEOL device making.
您感興趣的產品PRODUCTS YOU ARE INTERESTED IN
環保在線 設計制作，未經允許翻錄必究 .? ? ?
請輸入賬號
請輸入密碼
請輸驗證碼
