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深圳市韋儀科技有限公司
深圳市韋儀科技有限公司
santec Swept Test System The Santec Swept Test System has been developed to streamline photonic testing
ShenZhen Very Technology Co.Ltd.
深圳市韋儀科技有限公司
PIC: Ms.Huang
:
: 2469718855
: HW@wyvery.com.cn
The Santec Swept Test System has been developed to streamline photonic testing, providing a complete solution where high-speed analysis, along with high resolution and accuracy are key. Combining one of Santec’s tunable lasers (TSL-510 or TSL-710) with a Santec optical power meter (MPM-200), a polarization control unit (PCU-100) and custom software, the complete Swept Test System optimizes WDL and PDL measurement for use in both R&D and production environments.
Overview
Using real-time referencing, while simultaneously acquiring output power from the tunable laser and the transmitted optical power through the DUT, the system provides high accuracy in WDL and PDL analysis. The Mueller Matrix method is used to generate fast PDL measurements.
A simplified system is available by combining a Santec Swept Processing Unit (SPU-100) and any basic power meter or photodetector, the resulting Swept Test System variant can be used for WDL measurements. Over-sampling and a rescaling algorithms are used to maximize testing throughput while maintaining measurement integrity. The system is particularly suited to transmission spectra characterization such as those required for DWDM components and High Q photonic devices. Rapid sweep and accurate measurement saves time and ensures the integrity and validity of your device characterization.
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